Multi-material artifact correction – precision for the next generation

June 17, 2026

The continuous reduction of systematic deviations in computed tomography (CT) – known as artifacts – is one of the development priorities for the WinWerth®measurement software. As early as 2005, correction methods were integrated into the reconstruction of the digital workpiece volume in the TomoScope® 200, the world’s first machine developed specifically for coordinate measurement technology using X-ray CT.

To expand the range of applications for these machines, it is not enough to measure plastic workpieces quickly and accurately. Complex assemblies with highly absorbent materials such as metals or ceramics and, for example, combinations of plastic and copper must also be analyzed and measured with high precision. However, tomography of such multi-material workpieces produces significantly stronger artifacts, for example due to beam hardening, which considerably impair measurement accuracy and even make inspection impossible in some cases.

Accuracy and efficiency go hand in hand

To meet these challenges, various correction methods have been integrated into WinWerth®. Empirical artifact correction (EAK), which has been proven over decades, enables the correction of unknown artifacts based on a single tomography, but has so far been limited to use with single-material workpieces. Alternatively, multi-spectrum CT (MSP-CT) delivers very good results even for multi-material workpieces by taking two measurements with different X-ray spectra, but at the expense of measurement time. With the new MEAK (multi-material EAK), artifact-generating areas (e.g., metal contacts in connectors) are automatically detected after a measurement, and the artifacts generated are determined and removed. The result is a corrected volume with significantly reduced artifacts, which usually allows for reliable measurement and analysis.

Multi-material Empirical Artifact Correction (MEAK)

  • From WinWerth® Version 11.47
  • Only one tomography necessary
  • High measurement speed
  • For mono- and multi-material workpieces
  • High measurement accuracy
  • Fast, reliable, and universally applicable

The volume section of a connecting terminal impressively shows the difference between the original CT with artifacts and the volume corrected with MEAK.

 

 

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