Electronic / Semiconductor Testing Solution – E-LIT
Non-destructive Testing and Modular Automated Test Bench
E-LIT – Lock-In Thermography for electronics, from InfraTec (available in the UK and Ireland through Quantum Design UK and Ireland), is an automated testing solution system (as part of NDT techniques) which allows non-contact (electrical) failure analysis of semiconductor material during the manufacturing process. Inhomogeneous temperature distribution, local power loss, leakage currents, resistive vias, cold joints, latch-up effects and soldering issues can be measured with Lock-in Thermography. This is achieved by using the shortest measurement times combined with a high-performance thermographic camera and a specialised lock-in procedure.
- Thermal analysis of electronic and semiconductor devices
- Modular test bench for online lock-in measurement
- Reliable detection of thermal anomalies in the mK and μK range
- Spatial location of defects in multilayer PCBs and multi-chip modules
- Use of thermographic systemswith cooled and uncooled detectors
- Operational software IRBIS® 3 active with comprehensive analysis options in laboratory conditions
The power supply for this process is clocked with a synchronization module and failures that produce mK or even μK temperature differences are reliably detected by the Lock-in Thermography system.
Smallest defects at electronic components like point and line shunts, issues from overheating, internal (ohmic) shorts, oxide defects, transistor and diode failures on a PCB surface, in integrated circuits (IC´s), LED modules and battery cells can be detected and displayed in x and y positions. Additionally, it is possible to analyse stacked-die packages or multi-chip modules in z-direction with merely changing the lock-in frequency.
The powerful Lock-in Thermography software uses the latest algorithms and routines from most recent scientific publications.
E-LIT is extremely powerful also in resolving smallest geometrical structures as it can be equipped with strong microscopic lenses and additional SIL lenses. Identifying smallest structures with InfraTec´s E-LIT does not mean that the resulting field of view will also be smallest – implementing thermal cameras with detector sizes of up to (1,920 x 1,536) pixels provide large scale microscopic imaging. For even larger imaging stitching options are available.
InfraTec is available in the UK and Ireland through Quantum Design UK and Ireland. More information can be found at https://qd-uki.co.uk/electronic-semiconductor-testing-solution-e-lit/
or call Luke Nicholls on 01372 378822.
